000 | 02983nam a22004333i 4500 | ||
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001 | EBC5338881 | ||
003 | MiAaPQ | ||
005 | 20240724113110.0 | ||
006 | m o d | | ||
007 | cr cnu|||||||| | ||
008 | 240724s2017 xx o ||||0 eng d | ||
020 |
_a9789674611231 _q(electronic bk.) |
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020 | _z9789674611385 | ||
035 | _a(MiAaPQ)EBC5338881 | ||
035 | _a(Au-PeEL)EBL5338881 | ||
035 | _a(CaPaEBR)ebr11540395 | ||
035 | _a(OCoLC)1031337703 | ||
040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
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050 | 4 | _aTK7871.15.S56 .C443 2017 | |
082 | 0 | _a621.38152 | |
100 | 1 | _aCheah, Sook Fong. | |
245 | 1 | 0 | _aFabrication of Porous Gallium Nitride by Photoelectrochemical Etching Method. |
250 | _a1st ed. | ||
264 | 1 |
_aGelugor : _bPenerbit USM, _c2017. |
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264 | 4 | _c©2017. | |
300 | _a1 online resource (65 pages) | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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505 | 0 | _aCover -- Half Title Page -- Title Page -- Copyright Page -- Contents -- List of Tables -- List of Figures -- List of Symbols -- Preface -- List of Abbreviations -- 1 Introduction -- 2 Overview of the Fabrication of Porous GaN via Wet Etching Method -- 2.1 Chemical etching -- 2.2 Anodic etching -- 2.3 Metal-assisted electroless etching -- 2.4 UV-assisted photoelectrochemical etching -- 3 Attenuated Total Reflection Study of Porous Semiconductor -- 4 Methodology -- 4.1 Sample preparation -- 4.2 Experimental set-up for electrochemical etching approach -- 4.3 Characterizations -- 4.3.1 FESEM measurement -- 4.3.2 Polarized IR-ATR Measurement -- 4.3.3 PL measurement -- 4.3.4 ATR curve fitting -- 5 The Influences of Applied Voltages on the Surface Morphology and Optical Properties of Porous UID GaN Thin Films -- 5.1 FESEM analysis -- 5.2 p-polarized ATR study -- 5.3 PL analysis -- 6 The Influences of Applied Voltages on the Surface Morphology and Optical Properties of Porous Si-Doped GaN Thin Films -- 6.1 FESEM analysis -- 6.2 p-polarized ATR study -- 6.3 PL analysis -- 7 The Influences of Etching Durations on the Surface Morphology and Optical Properties of Porous Si-Doped GaN Thin Films -- 7.1 FESEM analysis -- 7.2 p-polarized ATR study -- 8 Conclusion -- Appendix -- References -- Index -- Back Cover. | |
588 | _aDescription based on publisher supplied metadata and other sources. | ||
590 | _aElectronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. | ||
650 | 0 | _aSilicon carbide. | |
655 | 4 | _aElectronic books. | |
700 | 1 | _aNg, Sha Shiong. | |
776 | 0 | 8 |
_iPrint version: _aCheah, Sook Fong _tFabrication of Porous Gallium Nitride by Photoelectrochemical Etching Method _dGelugor : Penerbit USM,c2017 _z9789674611385 |
797 | 2 | _aProQuest (Firm) | |
856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/orpp/detail.action?docID=5338881 _zClick to View |
999 |
_c869 _d869 |