| 000 | 07150nam a22005173i 4500 | ||
|---|---|---|---|
| 001 | EBC4436069 | ||
| 003 | MiAaPQ | ||
| 005 | 20240729130336.0 | ||
| 006 | m o d | | ||
| 007 | cr cnu|||||||| | ||
| 008 | 240724s2015 xx o ||||0 eng d | ||
| 020 |
_a9781119011873 _q(electronic bk.) |
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| 035 | _a(MiAaPQ)EBC4436069 | ||
| 035 | _a(Au-PeEL)EBL4436069 | ||
| 035 | _a(CaPaEBR)ebr11169669 | ||
| 035 | _a(CaONFJC)MIL902573 | ||
| 035 | _a(OCoLC)900635427 | ||
| 040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
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| 050 | 4 | _aTA1570 -- .F863 2016eb | |
| 082 | 0 | _a621.36/2 | |
| 100 | 1 | _aVincent, John David. | |
| 245 | 1 | 0 | _aFundamentals of Infrared and Visible Detector Operation and Testing. |
| 250 | _a2nd ed. | ||
| 264 | 1 |
_aNewark : _bJohn Wiley & Sons, Incorporated, _c2015. |
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| 264 | 4 | _c©2016. | |
| 300 | _a1 online resource (646 pages) | ||
| 336 |
_atext _btxt _2rdacontent |
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| 337 |
_acomputer _bc _2rdamedia |
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| 338 |
_aonline resource _bcr _2rdacarrier |
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| 490 | 1 | _aWiley Series in Pure and Applied Optics Series | |
| 505 | 0 | _aIntro -- Series Page -- Title Page -- Copyright -- Table of Contents -- Dedication -- Foreword -- Preface -- About the Companion Website -- Part I: Detector Basics -- Chapter 1: Introduction and Overview -- 1.1 Electromagnetic Radiation -- 1.2 Heat Transfer -- 1.3 Thermal Detectors -- 1.4 Planck's Law -- 1.5 Waves and Photons -- 1.6 Quantum (Photon) Detectors Versus Thermal Detectors -- 1.7 Detectors as Transducers -- 1.8 Detector Parameters: Definitions -- 1.9 Sources of Additional Information -- References -- Chapter 2: Radiometry -- 2.1 The General Problem and Our Approach -- 2.2 Spectral Content -- 2.3 Spatial Integral -- 2.4 Time Dependence (Modulation) -- 2.5 Examples and Cases of Special Interest -- 2.6 Fortran Computer Code for Radiometric Calculations -- 2.7 Sources of Additional Information -- References -- Chapter 3: Thermal Detectors: Mechanisms, Operation, and Performance -- 3.1 Introduction -- 3.2 Performance Predictions -- 3.3 Specific Thermal Detectors -- 3.4 Sources of Additional Information -- References -- Chapter 4: Classical Photon Detectors: Simple Photoconductor and Photovoltaics -- 4.1 Bandgap and Spectral Response of Photon Detectors -- 4.2 Temperature Dependence -- 4.3 Classical Detectors -- 4.4 Detector Materials and Choice Between PC and PV Devices -- 4.5 Photocurrent and Responsivity: First-Order Predictions -- 4.6 Noise: First-Order Prediction -- 4.7 Composite Figures of Merit -- 4.8 Better Detector Models -- 4.9 Detector Operation -- 4.10 Front-End Electronics: Bias Control and Load Line -- References -- Chapter 5: Modern Photon Detectors -- 5.1 Detector Materials -- 5.2 PC Detectors and Simple Variations -- 5.3 PV Detectors and Variants -- 5.4 Structures Using Lattice-Engineered Materials -- 5.5 Sources of Additional Information -- References -- Part II: Detector Assemblies. | |
| 505 | 8 | _aChapter 6: Single Detector Assemblies and Small Arrays -- 6.1 Introduction -- 6.2 Detector Types -- 6.3 Applications -- 6.4 Required Electronic Functions -- 6.5 Mechanical Issues -- 6.6 Testing -- 6.7 The Future -- 6.8 Sources of Additional Information -- References -- Chapter 7: Readout Integrated Circuits -- 7.1 Introduction -- 7.2 Functions Within the ROIC -- 7.3 Unit Cell Preamplifier Families -- 7.4 ROIC Figures of Merit and Testing -- 7.5 ROIC Calibration, Noise, and Nonlinearity -- 7.6 Handling of ROICs -- 7.7 Commisioning A Custom ROIC -- 7.8 Sources of Additional Information -- Reference -- Chapter 8: Electronics for FPA Operation -- 8.1 Starting Point and FPA Architecture -- 8.2 FPA Drive Signals -- 8.3 Outputs -- 8.4 Output Capture -- 8.5 Dedicated Electronics Versus Test Electronics -- 8.6 The Dewar and FPA Mounting -- 8.7 Setup and Test of an FPA -- Part III: Testing -- Chapter 9: Test Equipment -- 9.1 Types of Test Setups -- 9.2 Design and Documentation -- 9.3 Sources -- 9.4 Dewars and Chambers -- 9.5 Between The Source and The Detector -- 9.6 The Radiometric Calibration Problem -- 9.7 Electronics -- 9.8 Software -- 9.9 Test Set Evaluation and Troubleshooting -- 9.10 Sources of Additional Information -- References -- Chapter 10: Detector Testing -- 10.1 Preparation -- 10.2 Nature of The "Raw Data" -- 10.3 Measurement of General Detector Characteristics -- 10.4 Testing Unique to FPAs -- 10.5 "Other Tests" - Special Situations -- 10.6 Calibration of The UUT -- 10.7 Test Reports -- 10.8 Testing in Other Spectral Regions: X-Rays, UV, Visible -- 10.9 The Future -- 10.10 Sources of Additional Information -- References -- Part IV: Related Skills -- Chapter 11: Measurements and Uncertainty -- 11.1 Measurements1 -- 11.2 Experimental Error -- 11.3 Estimating Uncertainties -- 11.4 Probability -- 11.5 Propagation of Errors. | |
| 505 | 8 | _a11.6 Reporting Uncertainties -- 11.7 The Ethics of Scientific Work -- 11.8 Overall Test Task -- 11.9 Sources of Additional Information -- References -- Chapter 12: Cryogenics -- 12.1 Cryogens -- 12.2 Thermal Properties of Solids -- 12.3 Dewar Design -- 12.4 Refrigerators -- 12.5 Temperature Measurement -- 12.6 Cryogenics and Safety -- 12.7 Sources of Additional Information -- References -- Chapter 13: Vacuum -- 13.1 Introduction -- 13.2 Gauges -- 13.3 Pumps -- 13.4 Pumping Dynamics -- 13.5 Leaks -- 13.6 Adequate Vacuum for Test Dewars -- 13.7 Vacuum and Safety -- 13.8 Sources of Additional Information -- References -- Chapter 14: Optics and Optical Materials -- 14.1 Infrared Optical Materials -- 14.2 Geometrical Optics -- 14.3 Reflectance and Transmittance -- 14.4 Interference Effects -- 14.5 Diffraction -- 14.6 Lenses -- 14.7 Sources of Additional Information -- References -- Chapter 15: Fourier Analysis of Detector Problems -- 15.1 Introduction and Preliminaries -- 15.2 Aids to Application of the Fourier Transforms -- 15.3 Discussion and Examples of Fourier Transforms -- 15.4 Complications Associated with Real Data -- 15.5 Fourier Methods for Real Data - The DFT and FFT -- 15.6 The Transfer Function and Its Application -- 15.7 Correlation and Convolution -- 15.8 Other Applications of the Fourier Processes -- 15.9 Sources of Additional Information -- References -- Appendix A: Symbols, Abbreviations, and Acronyms -- Index -- Wiley Series in Pure and Applied Optics -- End User License Agreement. | |
| 588 | _aDescription based on publisher supplied metadata and other sources. | ||
| 590 | _aElectronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. | ||
| 650 | 0 | _aInfrared detectors. | |
| 655 | 4 | _aElectronic books. | |
| 700 | 1 | _aHodges, Steve. | |
| 700 | 1 | _aVampola, John. | |
| 700 | 1 | _aStegall, Mark. | |
| 700 | 1 | _aPierce, Greg. | |
| 776 | 0 | 8 |
_iPrint version: _aVincent, John David _tFundamentals of Infrared and Visible Detector Operation and Testing _dNewark : John Wiley & Sons, Incorporated,c2015 |
| 797 | 2 | _aProQuest (Firm) | |
| 830 | 0 | _aWiley Series in Pure and Applied Optics Series | |
| 856 | 4 | 0 |
_uhttps://ebookcentral.proquest.com/lib/orpp/detail.action?docID=4436069 _zClick to View |
| 999 |
_c107372 _d107372 |
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