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	1.	Metrology : from Physics Fundamentals to Quality of Life. by Tavella, P Milton, M. J. T Inguscio, M Series: International School of Physics Enrico Fermi Series Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Amsterdam : IOS Press, Incorporated, 2018Copyright date: ©2018 Online resources: Click to View Availability: No items available. Add to cart (remove)
	2.	New Frontiers for Metrology : from Biology and Chemistry to Quantum and Data Science. by Milton, M. J. T Wiersma, D. S Williams, C. J Series: Proceedings of the International School of Physics Enrico Fermi Series Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Amsterdam : IOS Press, Incorporated, 2021Copyright date: ©2021 Online resources: Click to View Availability: No items available. Add to cart (remove)
	3.	Advances in Optical Surface Texture Metrology. by Leach, Richard Su, Rong Danzl, Reinhard Helmli, Franz Repitsch, Claudia Zangl, Kerstin Artigas, Roger Feng, Xiaobing Du, Zhengchun Yang, Jian'guo Series: IOP Series in Emerging Technologies in Optics and Photonics Series Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Bristol : Institute of Physics Publishing, 2020Copyright date: ©2020 Online resources: Click to View Availability: No items available. Add to cart (remove)
	4.	Advances in Optical Form and Coordinate Metrology. by Leach, Richard Senin, Nicola Catalucci, Sofia Isa, Mohammed A Piano, Samanta Sims-Waterhouse, Danny Chen, Rui Xu, Jing Zhang, Song Eastwood, Joe Series: IOP Series in Emerging Technologies in Optics and Photonics Series Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Bristol : Institute of Physics Publishing, 2021Copyright date: ©2020 Online resources: Click to View Availability: No items available. Add to cart (remove)
	5.	Terahertz Metrology. by Naftaly, Mira Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Norwood : Artech House, 2014Copyright date: ©2015 Online resources: Click to View Availability: No items available. Add to cart (remove)
	6.	Quantum Metrology : Foundation of Units and Measurements. by Göbel, Ernst O Siegner, Uwe Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Newark : John Wiley & Sons, Incorporated, 2015Copyright date: ©2015 Online resources: Click to View Availability: No items available. Add to cart (remove)
	7.	Production Metrology. by Pfeifer, Tilo Edition: 1st ed. Material type: Text; Format: available online ; Literary form: Not fiction Publisher: Berlin/München/Boston : Walter de Gruyter GmbH, 2002Copyright date: ©2002 Online resources: Click to View Availability: No items available. Add to cart (remove)

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