Luger, Peter. <br/><br/>
Modern X-Ray Analysis on Single Crystals. 

 - 1st ed. 
 - 1 online resource (328 pages) 
<br/><br/>Intro -- 1 Theoretical Basis -- 1.1 Matrices, Vectors -- 1.2 Fundamental Results of Diffraction Theory -- 2 Preliminary Experiments -- 2.1 Film Methods -- 2.2 X-Rays -- 2.3 Practicing Film Techniques -- 3 Crystal Symmetry -- 3.1 Symmetry Operations in a Crystal Lattice -- 3.2 Crystal Symmetry and Related Intensity Symmetry -- 3.3 Space Group Determination -- 4 Diffractometer Measurements -- 4.1 Main Characteristics of a Four-Circle Diffractometer -- 4.2 Single Crystal Measurements -- 5 Solution of the Phase Problem -- 5.1 Preparation of the Intensity Data -- 5.2 Fourier Methods -- 5.3 Direct Methods -- 6 Refinement -- 6.1 Theoretical Aspects -- 6.2 Practising Least-Squares Methods -- 6.3 Analysis and Representation of Results -- 6.4 Applications to the Test Structures -- Index. 
<br/><br/> No detailed description available for "Modern X-Ray Analysis on Single Crystals". 
<br/><br/><label>ISBN: </label>9783110836899 
<br/><br/><label>Subjects--Topical Terms: </label><br/>X-ray crystallography.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>QD945.L77