TY  - BOOK
AU  - Czanderna,Alvin W.
AU  - Madey,Theodore E.
AU  - Powell,Cedric J.
TI  - Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis
T2  - Methods of Surface Characterization Series
SN  - 9780306469145
AV  - TA418.5-.84 
U1  - 530.417 
PY  - 1998///
CY  - New York, NY
PB  - Springer
KW  - Surfaces (Technology) -- Analysis
KW  - Electronic books
N1  - Intro -- Contents
UR  - https://ebookcentral.proquest.com/lib/orpp/detail.action?docID=3035362
ER  -