Czanderna, Alvin W. <br/><br/>
Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis. 

 - 1st ed. 
 - 1 online resource (451 pages) 
 - Methods of Surface Characterization Series ;  v.5 .
 - Methods of Surface Characterization Series .
<br/><br/>Intro -- Contents. 
<br/><br/><label>ISBN: </label>9780306469145 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Surfaces (Technology) -- Analysis.
<br/><br/><label>Index Terms--Genre/Form: </label><br/>Electronic books.
<br/><br/><label>LC Class. No.: </label>TA418.5-.84 
<br/><br/><label>Dewey Class. No.: </label>530.417