ORPP logo
Image from Google Jackets

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis.

By: Contributor(s): Material type: TextTextSeries: Methods of Surface Characterization SeriesPublisher: New York, NY : Springer, 1998Copyright date: ©2002Edition: 1st edDescription: 1 online resource (451 pages)Content type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780306469145
Subject(s): Genre/Form: Additional physical formats: Print version:: Beam Effects, Surface Topography, and Depth Profiling in Surface AnalysisDDC classification:
  • 530.417
LOC classification:
  • TA418.5-.84
Online resources:
Contents:
Intro -- Contents.
Tags from this library: No tags from this library for this title. Log in to add tags.
Star ratings
    Average rating: 0.0 (0 votes)
No physical items for this record

Intro -- Contents.

Description based on publisher supplied metadata and other sources.

Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.

There are no comments on this title.

to post a comment.

© 2024 Resource Centre. All rights reserved.