Next Generation HALT and HASS : Robust Design of Electronics and Systems.

Intro -- Title Page -- Table of Contents -- Series Editor's Foreword -- Preface -- List of Acronyms -- Introduction -- 1 Basis and Limitations of Typical Current Reliability Methods and Metrics -- 1.1 The Life Cycle Bathtub Curve -- 1.2 HALT and HASS Approach -- 1.3 The Future of Electronics: Higher Density and Speed and Lower Power -- 1.4 Use of MTBF as a Reliability Metric -- 1.5 MTBF: What is it Good For? -- 1.6 Reliability of Systems is Complex -- 1.7 Reliability Testing -- 1.8 Traditional Reliability Development -- Bibliography -- 2 The Need for Reliability Assurance Reference Metrics to Change -- 2.1 Wear-Out and Technology Obsolescence of Electronics -- 2.2 Semiconductor Life Limiting Mechanisms -- 2.3 Lack of Root Cause Field Unreliability Data -- 2.4 Predicting Reliability -- 2.5 Reliability Predictions - Continued Reliance on a Misleading Approach -- 2.6 Stress-Strength Diagram and Electronics Capability -- 2.7 Testing to Discover Reliability Risks -- 2.8 Stress-Strength Normal Assumption -- 2.9 A Major Challenge - Distributions Data -- 2.10 HALT Maximizes the Design's Mean Strength -- 2.11 What Does the Term HALT Actually Mean? -- Bibliography -- 3 Challenges to Advancing Electronics Reliability Engineering -- 3.1 Disclosure of Real Failure Data is Rare -- 3.2 Electronics Materials and Manufacturing Evolution -- Bibliography -- 4 A New Deterministic Reliability Development Paradigm -- 4.1 Introduction -- 4.2 Understanding Customer Needs and Expectations -- 4.3 Anticipating Risks and Potential Failure Modes -- 4.4 Robust Design for Reliability -- 4.5 Diagnostic and Prognostic Considerations and Features -- 4.6 Knowledge Capture for Reuse -- 4.7 Accelerated Test to Failure to Find Empirical Design Limits -- 4.8 Design Confirmation Testing: Quantitative Accelerated Life Test -- 4.9 Limitations of Success Based Compliance Test.

4.10 Production Validation Testing -- 4.11 Failure Analysis and Design Review Based on Test Results -- Bibliography -- 5 Common Understanding of HALT Approach is Critical for Success -- 5.1 HALT - Now a Very Common Term -- 5.2 HALT - Change from Failure Prediction to Failure Discovery -- 5.3 Serial Education of HALT May Increase Fear, Uncertainty and Doubt -- 6 The Fundamentals of HALT -- 6.1 Discovering System Stress Limits -- 6.2 HALT is a Simple Concept - Adaptation is the Challenge -- 6.3 Cost of Reliable vs Unreliable Design -- 6.4 HALT Stress Limits and Estimates of Failure Rates -- 6.5 Defining Operational Limit and Destruct Limits -- 6.6 Efficient Cooling and Heating in HALT -- 6.7 Applying HALT -- 6.8 Thermal HALT Process -- 6.9 Random Vibration HALT -- 6.10 Product Configurations for HALT -- 6.11 Lessons Learned from HALT -- 6.12 Failure Analysis after HALT -- 7 Highly Accelerated Stress Screening (HASS) and Audits (HASA) -- 7.1 The Use of Stress Screening on Electronics -- 7.2 'Infant Mortality' Failures are Reliability Issues -- 7.3 Developing a HASS -- 7.4 Unique Pneumatic Multi-axis RS Vibration Characteristics -- 7.5 HALT and HASS Case History -- Bibliography -- 7.6 Benefits of HALT and HASS with Prognostics and Health Management (PHM) -- Bibliography -- 8 HALT Benefits for Software/Firmware Performance and Reliability -- 8.1 Software - Hardware Interactions and Operational Reliability -- 8.2 Stimulation of Systematic Parametric Variations -- Bibliography -- 9 Design Confirmation Test -- 9.1 Introduction to Accelerated Life Test -- 9.2 Accelerated Degradation Testing -- 9.3 Accelerated Life Test Planning -- 9.4 Pitfalls of Accelerated Life Testing -- 9.5 Analysis Considerations -- Bibliography -- 10 Failure Analysis and Corrective Action -- 10.1 Failure Analysis and Knowledge Capture -- 10.2 Review of Test Results and Failure Analysis.

10.3 Capture Test and Failure Analysis Results for Access on Follow-on Projects -- 10.4 Analyzing Production and Field Return Failures -- Bibliography -- 11 Additional Applications of HALT Methods -- 11.1 Future of Reliability Engineering and HALT Methodology -- 11.2 Winning the Hearts and Minds of the HALT Skeptics -- 11.3 Test of No Fault Found Units -- 11.4 HALT for Reliable Supplier Selection -- 11.5 Comparisons of Stress Limits for Reliability Assessments -- 11.6 Multiple Stress Limit Boundary Maps -- 11.7 Robustness Indicator Figures -- 11.8 Focusing on Deterministic Weakness Discovery Will Lead to New Tools -- 11.9 Application of Limit Tests, AST and HALT Methodology to Products Other Than Electronics -- Bibliography -- Appendix: HALT and Reliability Case Histories -- A.1 HALT Program at Space Systems Loral -- A.2 Software Fault Isolation Using HALT and HASS -- A.3 Watlow HALT and HASS Application -- A.4 HALT and HASS Application in Electric Motor Control Electronics -- A.5 A HALT to HASS Case Study - Power Conversion Systems -- Index -- Wiley Series in Quality and Reliability Engineering -- End User License Agreement.

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Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.