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Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy : (Record no. 67444)

MARC details
000 -LEADER
fixed length control field 05317nam a22005413i 4500
001 - CONTROL NUMBER
control field EBC3078287
003 - CONTROL NUMBER IDENTIFIER
control field MiAaPQ
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20240729124500.0
006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS
fixed length control field m o d |
007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION
fixed length control field cr cnu||||||||
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 240724s1990 xx o ||||0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9781461306351
Qualifying information (electronic bk.)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
Canceled/invalid ISBN 9780306435911
035 ## - SYSTEM CONTROL NUMBER
System control number (MiAaPQ)EBC3078287
035 ## - SYSTEM CONTROL NUMBER
System control number (Au-PeEL)EBL3078287
035 ## - SYSTEM CONTROL NUMBER
System control number (CaPaEBR)ebr10923829
035 ## - SYSTEM CONTROL NUMBER
System control number (OCoLC)958528930
040 ## - CATALOGING SOURCE
Original cataloging agency MiAaPQ
Language of cataloging eng
Description conventions rda
-- pn
Transcribing agency MiAaPQ
Modifying agency MiAaPQ
050 #4 - LIBRARY OF CONGRESS CALL NUMBER
Classification number QH491-492
082 0# - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 502/.8/25
100 1# - MAIN ENTRY--PERSONAL NAME
Personal name Lyman, Charles E.
245 10 - TITLE STATEMENT
Title Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy :
Remainder of title A Laboratory Workbook.
250 ## - EDITION STATEMENT
Edition statement 1st ed.
264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Place of production, publication, distribution, manufacture New York, NY :
Name of producer, publisher, distributor, manufacturer Springer,
Date of production, publication, distribution, manufacture, or copyright notice 1990.
264 #4 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE
Date of production, publication, distribution, manufacture, or copyright notice ©1990.
300 ## - PHYSICAL DESCRIPTION
Extent 1 online resource (415 pages)
336 ## - CONTENT TYPE
Content type term text
Content type code txt
Source rdacontent
337 ## - MEDIA TYPE
Media type term computer
Media type code c
Source rdamedia
338 ## - CARRIER TYPE
Carrier type term online resource
Carrier type code cr
Source rdacarrier
505 0# - FORMATTED CONTENTS NOTE
Formatted contents note Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy -- Copyright -- Foreword -- Preface to the Student -- Contents -- Part I SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS -- Laboratory 1 Basic SEM Imaging -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Part II ADVANCED SCANNING ELECTRON MICROSCOPY -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Part III ADVANCED X-RAY MICROANALYSIS -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Part IV ANALYTICAL ELECTRON MICROSCOPY -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- Part V GUIDE TO SPECIMEN PREPARATION -- Laboratory 28 Bulk Specimens for SEM and X-Ray Microanalysis -- Laboratory 29 Thin Specimens for TEM and AEM -- Laboratory 30 Coating Methods.
505 8# - FORMATTED CONTENTS NOTE
Formatted contents note Part I SCANNING ELECTRON MICROSCOPY AND X-RAY MICROANALYSIS SOLUTIONS -- Laboratory 2 Electron Beam Parameters -- Laboratory 3 Image Contrast and Quality -- Laboratory 4 Stereo Microscopy -- Laboratory 5 Energy-Dispersive X-Ray Spectrometry -- Laboratory 6 Energy-Dispersive X-Ray Microanalysis -- Laboratory 7 Wavelength-Dispersive X-Ray Spectrometry and Microanalysis -- Part II ADVANCED SCANNING ELECTRON MICROSCOPY SOLUTIONS -- Laboratory 8 Backscattered Electron Imaging -- Laboratory 9 Scanning Transmission Imaging in the SEM -- Laboratory 10 Low-Voltage SEM -- Laboratory 11 High-Resolution SEM Imaging -- Laboratory 12 SE Signal Components -- Laboratory 13 Electron Channeling Contrast -- Laboratory 14 Magnetic Contrast -- Laboratory 15 Voltage Contrast and EBIC -- Laboratory 16 Environmental SEM -- Laboratory 17 Computer-Aided Imaging -- Part III ADVANCED X-RAY MICROANALYSIS SOLUTIONS -- Laboratory 18 Quantitative Wavelength-Dispersive X-Ray Microanalysis -- Laboratory 19 Quantitative Energy-Dispersive X-Ray Microanalysis -- Laboratory 20 Light Element Microanalysis -- Laboratory 21 Trace Element Microanalysis -- Laboratory 22 Particle and Rough Surface Microanalysis -- Laboratory 23 X-Ray Images -- Part IV ANALYTICAL ELECTRON MICROSCOPY SOLUTIONS -- Laboratory 24 Scanning Transmission Imaging in the AEM -- Laboratory 25 X-Ray Microanalysis in the AEM -- Laboratory 26 Electron Energy Loss Spectrometry -- Laboratory 27 Convergent Beam Electron Diffraction -- Index.
588 ## - SOURCE OF DESCRIPTION NOTE
Source of description note Description based on publisher supplied metadata and other sources.
590 ## - LOCAL NOTE (RLIN)
Local note Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Scanning electron microscopy--Laboratory manuals.
655 #4 - INDEX TERM--GENRE/FORM
Genre/form data or focus term Electronic books.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Newbury, Dale E.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Goldstein, Joseph.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Williams, David B.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Romig Jr., Alton D.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Armstrong, John.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Echlin, Patrick.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Fiori, Charles.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Joy, David C.
700 1# - ADDED ENTRY--PERSONAL NAME
Personal name Lifshin, Eric.
776 08 - ADDITIONAL PHYSICAL FORM ENTRY
Relationship information Print version:
Main entry heading Lyman, Charles E.
Title Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy
Place, publisher, and date of publication New York, NY : Springer,c1990
International Standard Book Number 9780306435911
797 2# - LOCAL ADDED ENTRY--CORPORATE NAME (RLIN)
Corporate name or jurisdiction name as entry element ProQuest (Firm)
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://ebookcentral.proquest.com/lib/orpp/detail.action?docID=3078287">https://ebookcentral.proquest.com/lib/orpp/detail.action?docID=3078287</a>
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