Structure from Diffraction Methods. (Record no. 37097)
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| fixed length control field | 09117nam a22005053i 4500 |
| 001 - CONTROL NUMBER | |
| control field | EBC1712954 |
| 003 - CONTROL NUMBER IDENTIFIER | |
| control field | MiAaPQ |
| 005 - DATE AND TIME OF LATEST TRANSACTION | |
| control field | 20240729122836.0 |
| 006 - FIXED-LENGTH DATA ELEMENTS--ADDITIONAL MATERIAL CHARACTERISTICS | |
| fixed length control field | m o d | |
| 007 - PHYSICAL DESCRIPTION FIXED FIELD--GENERAL INFORMATION | |
| fixed length control field | cr cnu|||||||| |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 240724s2014 xx o ||||0 eng d |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| International Standard Book Number | 9781118695715 |
| Qualifying information | (electronic bk.) |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER | |
| Canceled/invalid ISBN | 9781119953227 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (MiAaPQ)EBC1712954 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (Au-PeEL)EBL1712954 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaPaEBR)ebr10902336 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (CaONFJC)MIL633681 |
| 035 ## - SYSTEM CONTROL NUMBER | |
| System control number | (OCoLC)881571476 |
| 040 ## - CATALOGING SOURCE | |
| Original cataloging agency | MiAaPQ |
| Language of cataloging | eng |
| Description conventions | rda |
| -- | pn |
| Transcribing agency | MiAaPQ |
| Modifying agency | MiAaPQ |
| 050 #4 - LIBRARY OF CONGRESS CALL NUMBER | |
| Classification number | QD461 |
| 100 1# - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Bruce, Duncan W. |
| 245 10 - TITLE STATEMENT | |
| Title | Structure from Diffraction Methods. |
| 250 ## - EDITION STATEMENT | |
| Edition statement | 1st ed. |
| 264 #1 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Place of production, publication, distribution, manufacture | Newark : |
| Name of producer, publisher, distributor, manufacturer | John Wiley & Sons, Incorporated, |
| Date of production, publication, distribution, manufacture, or copyright notice | 2014. |
| 264 #4 - PRODUCTION, PUBLICATION, DISTRIBUTION, MANUFACTURE, AND COPYRIGHT NOTICE | |
| Date of production, publication, distribution, manufacture, or copyright notice | ©2014. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 1 online resource (356 pages) |
| 336 ## - CONTENT TYPE | |
| Content type term | text |
| Content type code | txt |
| Source | rdacontent |
| 337 ## - MEDIA TYPE | |
| Media type term | computer |
| Media type code | c |
| Source | rdamedia |
| 338 ## - CARRIER TYPE | |
| Carrier type term | online resource |
| Carrier type code | cr |
| Source | rdacarrier |
| 490 1# - SERIES STATEMENT | |
| Series statement | Inorganic Materials Series |
| 505 0# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | Cover -- Title Page -- Copyright -- Contents -- Inorganic Materials Series Preface -- Preface -- List of Contributors -- Chapter 1 Powder Diffraction -- 1.1 Introduction -- 1.2 The Similarities and Differences between Single-Crystal XRD and Powder XRD -- 1.3 Qualitative Aspects of Powder XRD: Fingerprinting of Crystalline Phases -- 1.4 Quantitative Aspects of Powder XRD: Some Preliminaries Relevant to Crystal Structure Determination -- 1.4.1 Relationship between a Crystal Structure and its Diffraction Pattern -- 1.4.2 Comparison of Experimental and Calculated Powder XRD Patterns -- 1.5 Structure Determination from Powder XRD Data -- 1.5.1 Overview -- 1.5.2 Unit Cell Determination (Indexing) -- 1.5.3 Preparing the Intensity Data for Structure Solution: Profile Fitting -- 1.5.4 Structure Solution -- 1.5.5 Structure Refinement -- 1.6 Some Experimental Considerations in Powder XRD -- 1.6.1 Synchrotron versus Laboratory Powder XRD Data -- 1.6.2 Preferred Orientation -- 1.6.3 Phase Purity of the Powder Sample -- 1.6.4 Analysis of Peak Widths in Powder XRD Data -- 1.6.5 Applications of Powder XRD for In Situ Studies of Structural Transformations and Chemical Processes -- 1.7 Powder Neutron Diffraction versus Powder XRD -- 1.8 Validation of Procedures and Results in Structure Determination from Powder XRD Data -- 1.8.1 Overview -- 1.8.2 Validation before Direct-Space Structure Solution -- 1.8.3 Aspects of Validation following Structure Refinement -- 1.9 More Detailed Consideration of the Application of Powder XRD as a Fingerprint of Crystalline Phases -- 1.10 Examples of the Application of Powder XRD in Chemical Contexts -- 1.10.1 Overview -- 1.10.2 Structure Determination of Zeolites and Other Framework Materials -- 1.10.3 In Situ Powder XRD Studies of Materials Synthesis. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 1.10.4 Structure Determination of New Materials Produced by Solid-State Mechanochemistry -- 1.10.5 In Situ Powder XRD Studies of Solid-State Mechanochemical Processes -- 1.10.6 In Situ Powder XRD Studies of a Polymorphic Transformation -- 1.10.7 In Situ Powder XRD Studies of a Solid-State Reaction -- 1.10.8 Establishing Details of a Hydrogen-Bonding Arrangement by Powder Neutron Diffraction -- 1.10.9 Structure Determination of a Material Produced by Rapid Precipitation from Solution -- 1.10.10 Structure Determination of Intermediates in a Solid-State Reaction -- 1.10.11 Structure Determination of a Novel Aluminium Methylphosphonate -- 1.10.12 Structure Determination of Materials Prepared by Solid-State Dehydration/Desolvation Processes -- 1.10.13 Structure Determination of the Product Material from a Solid-State Photopolymerisation Reaction -- 1.10.14 Exploiting Anisotropic Thermal Expansion in Structure Determination -- 1.10.15 Rationalisation of a Solid-State Reaction -- 1.10.16 Structure Determination of Organometallic Complexes -- 1.10.17 Examples of Structure Determination of Some Polymeric Materials -- 1.10.18 Structure Determination of Pigment Materials -- 1.11 Concluding Remarks -- References -- Chapter 2 X-Ray and Neutron Single-Crystal Diffraction -- 2.1 Introduction -- 2.2 Solid-State Fundamentals -- 2.2.1 Translation Symmetry -- 2.2.2 Other Symmetry -- 2.2.3 An Introduction to Non-Ideal Behaviour -- 2.3 Scattering and Diffraction -- 2.3.1 Fundamentals of Radiation and Scattering -- 2.3.2 Diffraction of Monochromatic X-Rays -- 2.3.3 Diffraction of Polychromatic X-Rays -- 2.3.4 Diffraction of Neutrons -- 2.3.5 Some Competing and Complicating Effects -- 2.4 Experimental Methods -- 2.4.1 Radiation Sources -- 2.4.2 Single Crystals -- 2.4.3 Measuring the Diffraction Pattern -- 2.4.4 Correcting for Systematic Errors -- 2.5 Structure Solution. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 2.5.1 Direct Methods -- 2.5.2 Patterson Synthesis -- 2.5.3 Symmetry Arguments -- 2.5.4 Charge Flipping -- 2.5.5 Completing a Partial Structure Model -- 2.6 Structure Refinement -- 2.6.1 Minimisation and Weights -- 2.6.2 Parameters, Constraints and Restraints -- 2.6.3 Refinement Results -- 2.6.4 Computer Programs for Structure Solution and Refinement -- 2.7 Problem Structures, Special Topics, Validation and Interpretation -- 2.7.1 Disorder -- 2.7.2 Twinning -- 2.7.3 Pseudosymmetry, Superstructures and Incommensurate Structures -- 2.7.4 Absolute Structure -- 2.7.5 Distinguishing Element Types, Oxidation States and Spin States -- 2.7.6 Valence Effects -- 2.7.7 Diffraction Experiments under Non-Ambient Conditions -- 2.7.8 Issues of Interpretation and Validation -- Software Acknowledgements -- References -- Chapter 3 PDF Analysis of Nanoparticles -- 3.1 Introduction -- 3.2 Pair Distribution Function -- 3.3 Data Collection Strategies -- 3.4 Data Treatment -- 3.4.1 Calculation of G(r) from a Structural Model -- 3.4.2 Data Modelling -- 3.5 Examples -- 3.5.1 Local Disorder versus Long-Range Average Order -- 3.5.2 ZnSe Nanoparticle -- 3.5.3 Decorated ZnO Nanoparticle -- 3.6 Complementary Techniques -- References -- Chapter 4 Electron Crystallography -- 4.1 Introduction -- 4.2 Crystal Description -- 4.2.1 Fourier Transformation and Related Functions -- 4.2.2 Lattices -- 4.2.3 Crystals and Crystal Structure Factors -- 4.2.4 Simple Description of Babinets Principle -- 4.3 Electron Microscopy -- 4.3.1 Interaction between Electrons and Matter -- 4.3.2 Scanning Electron Microscopy -- 4.3.3 Transmission Electron Microscopy -- 4.4 Electron Diffraction -- 4.4.1 X-Rays (Photons) versus Electrons -- 4.4.2 Scattering Power of an Atom -- 4.4.3 Crystal Structure and Electron Diffraction -- 4.4.4 Relationship between Real and Reciprocal Space. |
| 505 8# - FORMATTED CONTENTS NOTE | |
| Formatted contents note | 4.4.5 Friedels Law and Phase Restriction -- 4.4.6 Information on the 0th, 1st and Higher-Order Laue Zone -- 4.4.7 Determining Unit Cell Dimensions and Crystal Symmetry -- 4.4.8 Convergent Beam Electron Diffraction -- 4.5 Imaging -- 4.5.1 Crystal Structure and TEM Images -- 4.5.2 Image Resolution -- 4.5.3 Limitation of Structural Resolution -- 4.5.4 Electrostatic Potential and Structure Factors -- 4.5.5 Image Simulation -- 4.6 The EC Method of Solving Crystal Structures -- 4.6.1 1D Structures -- 4.6.2 2D Structures -- 4.6.3 3D Structures -- 4.7 Other TEM Techniques -- 4.7.1 STEM and HAADF -- 4.7.2 Electron Tomography -- 4.7.3 3D Electron Diffraction -- 4.8 Conclusion -- Acknowledgment -- References -- Chapter 5 Small-Angle Scattering -- 5.1 Introduction -- 5.2 General Principles of SAS -- 5.2.1 Momentum Transfer -- 5.2.2 Differential Scattering Cross-Section -- 5.2.3 Non-Interacting Systems -- 5.2.4 Influence of Polydispersity -- 5.2.5 Asymptotic Forms of I(q) -- 5.2.6 Multilevel Structures -- 5.2.7 Non-Particulate Systems -- 5.2.8 Structure Factor of Interactions -- 5.2.9 Highly Ordered Structures -- 5.3 Instrumental Set-Up for SAXS -- 5.3.1 Synchrotron Source -- 5.3.2 X-Ray Optics -- 5.3.3 X-Ray Detectors -- 5.3.4 SAXS Instrument Layout -- 5.4 Instrumental Set-Up for SANS -- 5.4.1 Neutron Sources -- 5.4.2 Neutron Optics -- 5.4.3 Neutron Detectors -- 5.4.4 SANS Instrument Layout -- 5.5 Additional Requirements for SAS -- 5.5.1 Combination with Wide-Angle Scattering -- 5.5.2 Instrumental Smearing Effects -- 5.5.3 Sample Environments -- 5.6 Application of SAS Methods -- 5.6.1 Real-Time and In Situ Studies -- 5.6.2 Ultra Small-Angle Scattering -- 5.6.3 Contrast Variation in SAS -- 5.6.4 Grazing-Incidence SAS -- 5.7 Conclusion -- Acknowledgements -- References -- Index. |
| 588 ## - SOURCE OF DESCRIPTION NOTE | |
| Source of description note | Description based on publisher supplied metadata and other sources. |
| 590 ## - LOCAL NOTE (RLIN) | |
| Local note | Electronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2024. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Inorganic compounds - Spectra. |
| 655 #4 - INDEX TERM--GENRE/FORM | |
| Genre/form data or focus term | Electronic books. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | O'Hare, Dermot. |
| 700 1# - ADDED ENTRY--PERSONAL NAME | |
| Personal name | Walton, Richard I. |
| 776 08 - ADDITIONAL PHYSICAL FORM ENTRY | |
| Relationship information | Print version: |
| Main entry heading | Bruce, Duncan W. |
| Title | Structure from Diffraction Methods |
| Place, publisher, and date of publication | Newark : John Wiley & Sons, Incorporated,c2014 |
| International Standard Book Number | 9781119953227 |
| 797 2# - LOCAL ADDED ENTRY--CORPORATE NAME (RLIN) | |
| Corporate name or jurisdiction name as entry element | ProQuest (Firm) |
| 830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE | |
| Uniform title | Inorganic Materials Series |
| 856 40 - ELECTRONIC LOCATION AND ACCESS | |
| Uniform Resource Identifier | <a href="https://ebookcentral.proquest.com/lib/orpp/detail.action?docID=1712954">https://ebookcentral.proquest.com/lib/orpp/detail.action?docID=1712954</a> |
| Public note | Click to View |
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