Transmission Electron Microscopy : A Textbook for Materials Science.
Williams, David B.
Transmission Electron Microscopy : A Textbook for Materials Science. - 1st ed. - 1 online resource (708 pages)
Transmission Electron Microscopy -- Copyright -- Foreword -- Preface -- Acknowledgments -- List of Acronyms -- List of Symbols -- Contents -- Transmission Electron Microscopy -- Basics I -- The Transmission Electron Microscope 1 -- Scattering and Diffraction 2 -- Elastic Scattering 3 -- Inelastic Scattering and Beam Damage 4 -- Electron Sources 5 -- Lenses, Apertures, and Resolution 6 -- How to "See" Electrons 7 -- Pumps and Holders 8 -- The Instrument 9 -- Specimen Preparation 10 -- Diffraction II -- Diffraction Patterns 11 -- Thinking in Reciprocal Space 12 -- Diffracted Beams 13 -- Bloch Waves 14 -- Dispersion Surfaces 15 -- Diffraction from Crystals 16 -- Diffraction from Small Volumes 17 -- Indexing Diffraction Patterns 18 -- Kikuchi Diffraction 19 -- Obtaining CBED Patterns 20 -- Using Convergent-Beam Techniques 21 -- Imaging III -- Imaging in the TEM 22 -- Thickness and Bending Effects 23 -- Planar Defects 24 -- Strain Fields 25 -- Weak-Beam Dark-Field Microscopy 26 -- Phase-Contrast Images 27 -- High-Resolution TEM 28 -- Image Simulation 29 -- Quantifying and Processing HRTEM Images 30 -- Other Imaging Techniques 31 -- Spectrometry IV -- X-ray Spectrometry 32 -- The XEDS-TEM Interface 33 -- Qualitative X-ray Analysis 34 -- Quantitative X-ray Microanalysis 35 -- Spatial Resolution and Minimum Detectability 36 -- Electron Energy-Loss Spectrometers 37 -- The Energy-Loss Spectrum 38 -- Microanalysis with Ionization-Loss Electrons 39 -- Everything Else in the Spectrum 40 -- Index -- Acknowledgments for Reproduction of Figures.
9781475725193
Materials--Microscopy.
Electronic books.
QD95-96
620.1/1299
Transmission Electron Microscopy : A Textbook for Materials Science. - 1st ed. - 1 online resource (708 pages)
Transmission Electron Microscopy -- Copyright -- Foreword -- Preface -- Acknowledgments -- List of Acronyms -- List of Symbols -- Contents -- Transmission Electron Microscopy -- Basics I -- The Transmission Electron Microscope 1 -- Scattering and Diffraction 2 -- Elastic Scattering 3 -- Inelastic Scattering and Beam Damage 4 -- Electron Sources 5 -- Lenses, Apertures, and Resolution 6 -- How to "See" Electrons 7 -- Pumps and Holders 8 -- The Instrument 9 -- Specimen Preparation 10 -- Diffraction II -- Diffraction Patterns 11 -- Thinking in Reciprocal Space 12 -- Diffracted Beams 13 -- Bloch Waves 14 -- Dispersion Surfaces 15 -- Diffraction from Crystals 16 -- Diffraction from Small Volumes 17 -- Indexing Diffraction Patterns 18 -- Kikuchi Diffraction 19 -- Obtaining CBED Patterns 20 -- Using Convergent-Beam Techniques 21 -- Imaging III -- Imaging in the TEM 22 -- Thickness and Bending Effects 23 -- Planar Defects 24 -- Strain Fields 25 -- Weak-Beam Dark-Field Microscopy 26 -- Phase-Contrast Images 27 -- High-Resolution TEM 28 -- Image Simulation 29 -- Quantifying and Processing HRTEM Images 30 -- Other Imaging Techniques 31 -- Spectrometry IV -- X-ray Spectrometry 32 -- The XEDS-TEM Interface 33 -- Qualitative X-ray Analysis 34 -- Quantitative X-ray Microanalysis 35 -- Spatial Resolution and Minimum Detectability 36 -- Electron Energy-Loss Spectrometers 37 -- The Energy-Loss Spectrum 38 -- Microanalysis with Ionization-Loss Electrons 39 -- Everything Else in the Spectrum 40 -- Index -- Acknowledgments for Reproduction of Figures.
9781475725193
Materials--Microscopy.
Electronic books.
QD95-96
620.1/1299