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Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis.

Czanderna, Alvin W.

Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis. - 1st ed. - 1 online resource (451 pages) - Methods of Surface Characterization Series ; v.5 . - Methods of Surface Characterization Series .

Intro -- Contents.

ISBN: 9780306469145

Subjects--Topical Terms:
Surfaces (Technology) -- Analysis.

Index Terms--Genre/Form:
Electronic books.

LC Class. No.: TA418.5-.84

Dewey Class. No.: 530.417

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